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A voltage-controlled capacitance offset calibration technique for high resolution dynamic comparator
Chan C.-H.; Zhu Y.; Chio U.-F.; Sin S.-W.; U S.P.; Martins R.P.
2009-12-01
Conference Name2009 International SoC Design Conference (ISOCC)
Source Publication2009 International SoC Design Conference, ISOCC 2009
Pages392-395
Conference Date22-24 Nov. 2009
Conference PlaceBusan, South Korea
Abstract

This paper presents a high resolution and wide range offset calibration technique for high resolution comparators. The proposed calibration technique significant reduces the calibration capacitance from conventional 2 binary-scaled capacitors array to a small voltage-controlled capacitor. Furthermore, it utilizes inherent system clock to perform calibration and does not require extra clock phase. After proposed calibration, simulation result shows an offset of conventional dynamic comparators being reduced from 35mV to 350μV (one sigma) operating at 1GHz in 65nm CMOS technology with only 20μW power in calibration. ©2009 IEEE.

KeywordDynamic Comparator Offset Calibration
DOI10.1109/SOCDC.2009.5423836
URLView the original
Indexed ByCPCI-S
Language英語English
WOS Research AreaComputer Science ; Engineering
WOS SubjectComputer Science, Hardware & Architecture ; Engineering, Electrical & Electronic
WOS IDWOS:000290246700097
Scopus ID2-s2.0-77951443753
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Citation statistics
Document TypeConference paper
CollectionINSTITUTE OF MICROELECTRONICS
Faculty of Science and Technology
DEPARTMENT OF ELECTRICAL AND COMPUTER ENGINEERING
AffiliationUniversidade de Macau
First Author AffilicationUniversity of Macau
Recommended Citation
GB/T 7714
Chan C.-H.,Zhu Y.,Chio U.-F.,et al. A voltage-controlled capacitance offset calibration technique for high resolution dynamic comparator[C], 2009, 392-395.
APA Chan C.-H.., Zhu Y.., Chio U.-F.., Sin S.-W.., U S.P.., & Martins R.P. (2009). A voltage-controlled capacitance offset calibration technique for high resolution dynamic comparator. 2009 International SoC Design Conference, ISOCC 2009, 392-395.
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