Residential College | false |
Status | 已發表Published |
Revisiting characteristic impedance and its definition of microstrip line with a self-calibration 3D MoM scheme | |
Zhu, L.; Wu, K. | |
1998-02-01 | |
Source Publication | IEEE Microwave and Guided Wave Letters |
ISSN | 1051-8207 |
Volume | 8Issue:2Pages:87-89 |
Abstract | Characteristic impedance and its definition are revisited and discussed for microstrip line with a self-calibrated threedimenional (3-D) method of moments (MoM). This 3-D MoM accommodates a scheme called short-open calibration (SOC) so that potential parasitic effects brought by the impressed voltage excitation and other relevant factors can be effectively removed. In this way, the characteristic impedance can be accurately defined through a relationship between equivalent voltage and current on the two sides of a microstrip line having a finite length. Simulated results are compared with the Jansen’s twodimensional (2-D) and Rautio’s 3-D definition. |
Keyword | Characteristic Impedance Method Of Moments Microstrip Line |
DOI | 10.1109/75.658650 |
Indexed By | SCIE |
Language | 英語English |
WOS Research Area | Engineering |
WOS Subject | Engineering, Electrical & Electronic |
WOS ID | WOS:000071828500014 |
The Source to Article | PB_Publication |
Scopus ID | 2-s2.0-0031999169 |
Fulltext Access | |
Citation statistics | |
Document Type | Journal article |
Collection | University of Macau |
Recommended Citation GB/T 7714 | Zhu, L.,Wu, K.. Revisiting characteristic impedance and its definition of microstrip line with a self-calibration 3D MoM scheme[J]. IEEE Microwave and Guided Wave Letters, 1998, 8(2), 87-89. |
APA | Zhu, L.., & Wu, K. (1998). Revisiting characteristic impedance and its definition of microstrip line with a self-calibration 3D MoM scheme. IEEE Microwave and Guided Wave Letters, 8(2), 87-89. |
MLA | Zhu, L.,et al."Revisiting characteristic impedance and its definition of microstrip line with a self-calibration 3D MoM scheme".IEEE Microwave and Guided Wave Letters 8.2(1998):87-89. |
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