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Revisiting characteristic impedance and its definition of microstrip line with a self-calibration 3D MoM scheme
Zhu, L.; Wu, K.
1998-02-01
Source PublicationIEEE Microwave and Guided Wave Letters
ISSN1051-8207
Volume8Issue:2Pages:87-89
Abstract

Characteristic impedance and its definition are revisited and discussed for microstrip line with a self-calibrated threedimenional (3-D) method of moments (MoM). This 3-D MoM accommodates a scheme called short-open calibration (SOC) so that potential parasitic effects brought by the impressed voltage excitation and other relevant factors can be effectively removed. In this way, the characteristic impedance can be accurately defined through a relationship between equivalent voltage and current on the two sides of a microstrip line having a finite length. Simulated results are compared with the Jansen’s twodimensional (2-D) and Rautio’s 3-D definition.

KeywordCharacteristic Impedance Method Of Moments Microstrip Line
DOI10.1109/75.658650
Indexed BySCIE
Language英語English
WOS Research AreaEngineering
WOS SubjectEngineering, Electrical & Electronic
WOS IDWOS:000071828500014
The Source to ArticlePB_Publication
Scopus ID2-s2.0-0031999169
Fulltext Access
Citation statistics
Document TypeJournal article
CollectionUniversity of Macau
Recommended Citation
GB/T 7714
Zhu, L.,Wu, K.. Revisiting characteristic impedance and its definition of microstrip line with a self-calibration 3D MoM scheme[J]. IEEE Microwave and Guided Wave Letters, 1998, 8(2), 87-89.
APA Zhu, L.., & Wu, K. (1998). Revisiting characteristic impedance and its definition of microstrip line with a self-calibration 3D MoM scheme. IEEE Microwave and Guided Wave Letters, 8(2), 87-89.
MLA Zhu, L.,et al."Revisiting characteristic impedance and its definition of microstrip line with a self-calibration 3D MoM scheme".IEEE Microwave and Guided Wave Letters 8.2(1998):87-89.
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