Residential College | false |
Status | 已發表Published |
Extraction of optical constants and thickness of nanometre scale TiO 2 film | |
Yang Y.-G.; Liu P.-J.; Wang Y.; Zhang Y.-F. | |
2005-11-01 | |
Source Publication | Chinese Physics |
ISSN | 10091963 |
Volume | 14Issue:11Pages:2335-2337 |
Abstract | TiO thin films were deposited on glass substrates by sputtering in a conventional rf magnetron sputtering system. X-ray diffraction pattern and transmission spectrum were measured. The curves of refraction index and extinction coefficient distributions as well as the thickness of films calculated from transmission spectrum were obtained. The optimization problem was also solved using a method based on a constrained nonlinear programming algorithm. © 2005 Chin. Phys. Soc. and IOP Publishing Ltd. |
Keyword | Constrained Nonlinear Programming Optical Constants Parameters Extraction Pointwise Constrained Optimization Approach Tio2 Thin Films |
DOI | 10.1088/1009-1963/14/11/032 |
URL | View the original |
Language | 英語English |
Scopus ID | 2-s2.0-27744544568 |
Fulltext Access | |
Citation statistics | |
Document Type | Journal article |
Collection | University of Macau |
Affiliation | Shanghai Jiao Tong University |
Recommended Citation GB/T 7714 | Yang Y.-G.,Liu P.-J.,Wang Y.,et al. Extraction of optical constants and thickness of nanometre scale TiO 2 film[J]. Chinese Physics, 2005, 14(11), 2335-2337. |
APA | Yang Y.-G.., Liu P.-J.., Wang Y.., & Zhang Y.-F. (2005). Extraction of optical constants and thickness of nanometre scale TiO 2 film. Chinese Physics, 14(11), 2335-2337. |
MLA | Yang Y.-G.,et al."Extraction of optical constants and thickness of nanometre scale TiO 2 film".Chinese Physics 14.11(2005):2335-2337. |
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